Scanning Tunneling microscopy (STM) is a widely used tool for atomic imaging of novel materials and its surface energetics. However, the optimization of the imaging conditions is a tedious process due to the extremely sensitive tip-surface interaction, and thus limits the throughput efficiency. Here we deploy a machine learning (ML) based framework to achieve optimal-atomically resolved imaging conditions in real time. The experimental workflow leverages Bayesian optimization (BO) method to rapidly improve the image quality, defined by the peak intensity in the Fourier space. The outcome of the BO prediction is incorporated into the microscope controls, i.e., the current setpoint and the tip bias, to dynamically improve the STM scan conditions. We present strategies to either selectively explore or exploit across the parameter space. As a result, suitable policies are developed for autonomous convergence of the control-parameters. The ML-based framework serves as a general workflow methodology across a wide range of materials.
@article{arxiv.2310.17765,
title = {Autonomous convergence of STM control parameters using Bayesian Optimization},
author = {Ganesh Narasimha and Saban Hus and Arpan Biswas and Rama Vasudevan and Maxim Ziatdinov},
journal= {arXiv preprint arXiv:2310.17765},
year = {2024}
}