Attosecond electron microscopy by free-electron homodyne detection
Abstract
Time-resolved electron microscopy aims at tracking nanoscale excitations and dynamic states of matter with a temporal resolution ultimately reaching the attosecond regime. Periodically time-varying fields in an illuminated specimen cause free-electron inelastic scattering, which enables the spectroscopic imaging of near-field intensities. However, access to the evolution of nanoscale fields and structures within the light cycle requires a sensitivity to the optical phase. Here, we introduce Free-Electron Homodyne Detection (FREHD) as a universally applicable approach to electron microscopy of phase-resolved optical responses at high spatiotemporal resolution. In this scheme, a phase-controlled reference interaction serves as the local oscillator to extract arbitrary sample-induced modulations of a free-electron wave function. We demonstrate this principle through the phase-resolved imaging of plasmonic fields with few-nanometer spatial and sub-cycle temporal resolutions. Due to its sensitivity to both phase- and amplitude-modulated electron beams, FREHD measurements will be able to detect and amplify weak signals stemming from a wide variety of microscopic origins, including linear and nonlinear optical polarizations, atomic and molecular resonances and attosecond-modulated structure factors.
Cite
@article{arxiv.2305.03005,
title = {Attosecond electron microscopy by free-electron homodyne detection},
author = {John H. Gaida and Hugo Lourenço-Martins and Murat Sivis and Thomas Rittmann and Armin Feist and F. Javier García de Abajo and Claus Ropers},
journal= {arXiv preprint arXiv:2305.03005},
year = {2024}
}