We carry out the molecular statics simulations of depinning of an edge dislocation at voids of diameters of the order of ~1 nm. We show that the dislocation-void interactions are non-trivial as the applied shear load is found to enhance the pinning strength of the nanovoid itself. This leads to the surprising observation of multiple CRSS values for a given nanovoid.
@article{arxiv.1003.4945,
title = {Anomalous interaction between dislocations and ultra-small voids},
author = {A. Dutta and M. Bhattacharya and P. Mukherjee and N. Gayathri and G. C. Das and P. Barat},
journal= {arXiv preprint arXiv:1003.4945},
year = {2010}
}