Anisotropic nanomaterials possess interesting thermal transport properties because they allow orientation of heat fluxes along preferential directions due to a high ratio (up to three orders of magnitude) between their in-plane and cross-plane thermal conductivities. Among different techniques allowing thermal conductivity evaluation, micro-Raman scattering is known to be one of the most efficient contactless measurement approaches. In this letter, a new experimental approach based on Raman scattering measurements with variable laser spot sizes is reported. Correlation between experimental and calculated thermal resistances of one-dimensional nanocrystalline solids allows simultaneous estimation of their in-plane and cross-plane thermal conductivities. In particular, our measurement approach is illustrated to be successfully applied for anisotropic thermal conductivity evaluation of silicon nanowire arrays.
@article{arxiv.1609.08133,
title = {Anisotropic heat conduction in silicon nanowire network revealed by Raman scattering},
author = {Mykola Isaiev and Oles Didukh and Tetyana Nychyporuk and Victor Timoshenko and Vladimir Lysenko},
journal= {arXiv preprint arXiv:1609.08133},
year = {2017}
}