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An Improved Line-Point Low-Degree Test

Computational Complexity 2023-11-22 v1

Abstract

We prove that the most natural low-degree test for polynomials over finite fields is ``robust'' in the high-error regime for linear-sized fields. Specifically we consider the ``local'' agreement of a function f:FqmFqf: \mathbb{F}_q^m \to \mathbb{F}_q from the space of degree-dd polynomials, i.e., the expected agreement of the function from univariate degree-dd polynomials over a randomly chosen line in Fqm\mathbb{F}_q^m, and prove that if this local agreement is ϵΩ((dq)τ))\epsilon \geq \Omega((\frac{d}{q})^\tau)) for some fixed τ>0\tau > 0, then there is a global degree-dd polynomial Q:FqmFqQ: \mathbb{F}_q^m \to \mathbb{F}_q with agreement nearly ϵ\epsilon with ff. This settles a long-standing open question in the area of low-degree testing, yielding an O(d)O(d)-query robust test in the ``high-error'' regime (i.e., when ϵ<12\epsilon < \frac{1}{2}). The previous results in this space either required ϵ>12\epsilon > \frac{1}{2} (Polishchuk \& Spielman, STOC 1994), or q=Ω(d4)q = \Omega(d^4) (Arora \& Sudan, Combinatorica 2003), or needed to measure local distance on 22-dimensional ``planes'' rather than one-dimensional lines leading to Ω(d2)\Omega(d^2)-query complexity (Raz \& Safra, STOC 1997). Our analysis follows the spirit of most previous analyses in first analyzing the low-variable case (m=O(1)m = O(1)) and then ``bootstrapping'' to general multivariate settings. Our main technical novelty is a new analysis in the bivariate setting that exploits a previously known connection between multivariate factorization and finding (or testing) low-degree polynomials, in a non ``black-box'' manner. A second contribution is a bootstrapping analysis which manages to lift analyses for m=2m=2 directly to analyses for general mm, where previous works needed to work with m=3m = 3 or m=4m = 4 -- arguably this bootstrapping is significantly simpler than those in prior works.

Keywords

Cite

@article{arxiv.2311.12752,
  title  = {An Improved Line-Point Low-Degree Test},
  author = {Prahladh Harsha and Mrinal Kumar and Ramprasad Saptharishi and Madhu Sudan},
  journal= {arXiv preprint arXiv:2311.12752},
  year   = {2023}
}
R2 v1 2026-06-28T13:27:37.387Z