An Anomalous Contrast of Insulators in Scanning Electron Microscope: The Split Image
Materials Science
2016-04-18 v1
Abstract
A novel phenomenon of anomalous contrast in scanning electron microscope when the instrument is used to observe an insulator specimen with a wolfram probe, we called double imaging, is reported in this article. We give a detail analysis of this phenomenon in its occurrence, and discuss the influence of the added probe to internal electric field which lead to the occurrence of double imaging.
Keywords
Cite
@article{arxiv.1604.04407,
title = {An Anomalous Contrast of Insulators in Scanning Electron Microscope: The Split Image},
author = {Lilin Xie and Xiaona Zhang},
journal= {arXiv preprint arXiv:1604.04407},
year = {2016}
}
Comments
9pages, 4 figures