English

Aleatoric and Epistemic Uncertainty Measures for Ordinal Classification through Binary Reduction

Machine Learning 2025-07-02 v1

Abstract

Ordinal classification problems, where labels exhibit a natural order, are prevalent in high-stakes fields such as medicine and finance. Accurate uncertainty quantification, including the decomposition into aleatoric (inherent variability) and epistemic (lack of knowledge) components, is crucial for reliable decision-making. However, existing research has primarily focused on nominal classification and regression. In this paper, we introduce a novel class of measures of aleatoric and epistemic uncertainty in ordinal classification, which is based on a suitable reduction to (entropy- and variance-based) measures for the binary case. These measures effectively capture the trade-off in ordinal classification between exact hit-rate and minimial error distances. We demonstrate the effectiveness of our approach on various tabular ordinal benchmark datasets using ensembles of gradient-boosted trees and multi-layer perceptrons for approximate Bayesian inference. Our method significantly outperforms standard and label-wise entropy and variance-based measures in error detection, as indicated by misclassification rates and mean absolute error. Additionally, the ordinal measures show competitive performance in out-of-distribution (OOD) detection. Our findings highlight the importance of considering the ordinal nature of classification problems when assessing uncertainty.

Keywords

Cite

@article{arxiv.2507.00733,
  title  = {Aleatoric and Epistemic Uncertainty Measures for Ordinal Classification through Binary Reduction},
  author = {Stefan Haas and Eyke Hüllermeier},
  journal= {arXiv preprint arXiv:2507.00733},
  year   = {2025}
}
R2 v1 2026-07-01T03:41:33.226Z