Accelerator Tests of Crystal Undulators
Abstract
A series of Silicon crystal undulator samples were produced based on the approach presented in PRL 90 (2003) 034801, with the periods of undulation from 0.1 mm to 1 mm, and the number of periods on the order of 10. The samples were characterized by X-rays, revealing the sine-like shape of the crystal lattice in the bulk. Next step in the characterization has been the channeling tests done with 70 GeV protons, where good channeling properties of the undulated Silicon lattice have been observed. The photon radiation tests of crystal undulators with high energy positrons are in progress on several locations: IHEP Protvino, LNF Frascati, and CERN SPS. The progress in the experimental activities and the predictions from detailed simulations are reported.
Cite
@article{arxiv.physics/0412159,
title = {Accelerator Tests of Crystal Undulators},
author = {V. M. Biryukov and A. G. Afonin and V. T. Baranov and S. Baricordi and S. Bellucci and G. I. Britvich and V. N. Chepegin and Yu. A. Chesnokov and C. Balasubramanian and G. Giannini and V. Guidi and Yu. M. Ivanov and V. I. Kotov and A. Kushnirenko and V. A. Maisheev and C. Malagu and G. Martinelli and E. Milan and A. A. Petrunin and V. A. Pikalov and V. V. Skorobogatov and M. Stefancich and V. I. Terekhov and F. Tombolini and U. I. Uggerhoj},
journal= {arXiv preprint arXiv:physics/0412159},
year = {2007}
}
Comments
Invited talk at the NATO ARW "Advanced Photon Sources and Their Application" (Nor Hamberd, Armenia August 29 – September 02, 2004)