Absolute spectral metrology of XFEL pulses using diffraction in crystals
Instrumentation and Detectors
2023-03-02 v1
Abstract
At modern X-ray sources, such as synchrotrons and X-ray Free-Electron Lasers (XFELs), it is important to measure the absolute value of the photon energy directly. Here, a method for absolute spectral metrology is presented. A photon energy estimation method based on the spectral measurements and rocking of diffracting crystals is presented. The photon energy of SASE1 channel of the European XFEL was measured, and the benefits and applications of the precise photon energy evaluation are discussed.
Cite
@article{arxiv.2303.00072,
title = {Absolute spectral metrology of XFEL pulses using diffraction in crystals},
author = {Ilia Petrov and Liubov Samoylova and Sarlota Birnsteinova and Valerio Bellucci and Mikako Makita and Tokushi Sato and Romain Letrun and Jayanath Koliyadu and Raphael de Wijn and Andrea Mazzolari and Marco Romagnoni and Richard Bean and Adrian Mancuso and Alke Meents and Henry N. Chapman and Patrik Vagovic},
journal= {arXiv preprint arXiv:2303.00072},
year = {2023}
}