We present a rotary-stage microwave probe station suitable for magnetic films and spintronic devices. Two stages, one for field rotation from parallel to perpendicular to the sample plane (Out-of-Plane) and the other intended for field rotation within the sample plane (In-Plane) have been designed. The sample, probes and micro positioners are rotated simultaneously with the stages, which allows the field orientation to cover θ from 0 to 90∘ and φ from 0 to 360∘. θ and φ being the angle between the direction of current flow and field in a Out-of-Plane and an In-Plane rotation, respectively. The operation frequency is up to 40 GHz and the magnetic field up to 1 T. The sample holder, vision system and probe assembly are compactly designed for the probes to land on a wafer with diameter up to 3cm. Using homemade multi-pin probes and commercially available high frequency probes, several applications including 4-probe DC measurements, the determination of domain wall velocity and spin transfer torque ferromagnetic resonance are demonstrated.
@article{arxiv.1607.04356,
title = {A versatile rotary-stage high frequency probe station for studying magnetic films and devices},
author = {Shikun He and Zhaoliang Meng and Lisen Huang and Lee Koon Yap and Tiejun Zhou and Christos Panagopoulos},
journal= {arXiv preprint arXiv:1607.04356},
year = {2016}
}