A vacuum double-crystal spectrometer for reference-free highly charged ions X-ray spectroscopy
Atomic Physics
2012-10-23 v2
Abstract
We have built a vacuum double crystal spectrometer, which coupled to an electron-cyclotron resonance ion source, allows to measure low-energy x-ray transitions in highly-charged ions with accuracies of the order of a few parts per million. We describe in detail the instrument and its performances. Furthermore, we present a few spectra of transitions in Ar, Ar and Ar. We have developed an ab initio simulation code that allows us to obtain accurate line profiles. It can reproduce experimental spectra with unprecedented accuracy. The quality of the profiles allows the direct determination of line width.
Keywords
Cite
@article{arxiv.1205.4520,
title = {A vacuum double-crystal spectrometer for reference-free highly charged ions X-ray spectroscopy},
author = {P. Amaro and C. I. Szabo and S. Schlesser and Alexandre Gumberidze and Ernest G. Kessler and Albert Henins and E. -O. Le Bigot and M. Trassinelli and Jean-Michel Isac and Pascal Travers and Mauro Guerra and J. P. Santos and Paul Indelicato},
journal= {arXiv preprint arXiv:1205.4520},
year = {2012}
}
Comments
21 pages; Version 2