In this paper we present our system design and methodology for making absolute quantum efficiency (QE) measurements through the vacuum ultraviolet (VUV) and verify the system with delta-doped silicon CCDs. Delta-doped detectors provide an excellent platform to validate measurements through the VUV due to their enhanced UV response. The requirements for measuring QE through the VUV are more strenuous than measurements in the near UV and necessitate, among other things, the use of a vacuum monochromator, good dewar chamber vacuum to prevent on-chip condensation, and more stringent handling requirements.
Cite
@article{arxiv.1102.2242,
title = {A system and methodologies for absolute QE measurements from the vacuum ultraviolet through the NIR},
author = {Blake C. Jacquot and Steve P. Monacos and Michael E. Hoenk and Frank Greer and Todd J. Jones and Shouleh Nikzad},
journal= {arXiv preprint arXiv:1102.2242},
year = {2015}
}
Comments
The following article has been submitted to/accepted by the Review of Scientific Instruments. After it is published, it will be found at http://rsi.aip.org/