A Simple Model to Measure Linewidth Enhancement Factor (\alpha) for Multi-wavelengths Semiconductor Laser
Optics
2011-06-21 v1
Abstract
A novel and simple model is proposed for the measurement of the linewidth enhancement factor (LEF) {\alpha} of multiwavelengths semiconductor laser. It is based on the suppression characteristics of an arbitrary mode while other modes are optically injection locked individually. The proposed model can be used to measure {\alpha} value of individual modes of multi-wavelengths laser with large mode spacing. As a proof of the concept, the model is used to experimentally measure {\alpha} of a mode of a slotted Fabry- P\'erot laser source.
Cite
@article{arxiv.1106.3676,
title = {A Simple Model to Measure Linewidth Enhancement Factor (\alpha) for Multi-wavelengths Semiconductor Laser},
author = {Samir K Mondal},
journal= {arXiv preprint arXiv:1106.3676},
year = {2011}
}