A simple high-sensitivity technique for purity analysis of xenon gas

D. S. Leonard; A. Dobi; C. Hall; L. Kaufman; T. Langford; S. Slutsky; Y. R. Yen

doi:10.1016/j.nima.2010.04.152

A simple high-sensitivity technique for purity analysis of xenon gas

Instrumentation and Detectors 2011-05-09 v2

Authors: D. S. Leonard , A. Dobi , C. Hall , L. Kaufman , T. Langford , S. Slutsky , Y. R. Yen

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Abstract

We report on the development and performance of a high-sensitivity purity-analysis technique for gaseous xenon. The gas is sampled at macroscopic pressure from the system of interest using a UHV leak valve. The xenon present in the sample is removed with a liquid-nitrogen cold trap, and the remaining impurities are observed with a standard vacuum mass-spectroscopy device. Using calibrated samples of xenon gas spiked with known levels of impurities, we find that the minimum detectable levels of N2, O2, and methane are 1 ppb, 160 ppt, and 60 ppt respectively. This represents an improvement of about a factor of 10,000 compared to measurements performed without a coldtrap.

Keywords

xenon gas purity analysis cold trap mass spectroscopy high sensitivity impurity detection

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@article{arxiv.1002.2742,
  title  = {A simple high-sensitivity technique for purity analysis of xenon gas},
  author = {D. S. Leonard and A. Dobi and C. Hall and L. Kaufman and T. Langford and S. Slutsky and Y. R. Yen},
  journal= {arXiv preprint arXiv:1002.2742},
  year   = {2011}
}

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20 pages, 5 figures

A simple high-sensitivity technique for purity analysis of xenon gas

Abstract

Keywords

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