English

A Semi-Supervised Learning Method for the Identification of Bad Exposures in Large Imaging Surveys

Instrumentation and Methods for Astrophysics 2026-03-02 v2 Artificial Intelligence

Abstract

As the data volume of astronomical imaging surveys rapidly increases, traditional methods for image anomaly detection, such as visual inspection by human experts, are becoming impractical. We introduce a machine-learning-based approach to detect poor-quality exposures in large imaging surveys, with a focus on the DECam Legacy Survey (DECaLS) in regions of low extinction (i.e., E(BV)<0.04E(B-V)<0.04). Our semi-supervised pipeline integrates a vision transformer (ViT), trained via self-supervised learning (SSL), with a k-Nearest Neighbor (kNN) classifier. We train and validate our pipeline using a small set of labeled exposures observed by surveys with the Dark Energy Camera (DECam). A clustering-space analysis of where our pipeline places images labeled in ``good'' and ``bad'' categories suggests that our approach can efficiently and accurately determine the quality of exposures. Applied to new imaging being reduced for DECaLS Data Release 11, our pipeline identifies 780 problematic exposures, which we subsequently verify through visual inspection. Being highly efficient and adaptable, our method offers a scalable solution for quality control in other large imaging surveys.

Keywords

Cite

@article{arxiv.2507.12784,
  title  = {A Semi-Supervised Learning Method for the Identification of Bad Exposures in Large Imaging Surveys},
  author = {Yufeng Luo and Adam D. Myers and Alex Drlica-Wagner and Dario Dematties and Salma Borchani and Francisco Valdes and Arjun Dey and David Schlegel and Rongpu Zhou and DESI Legacy Imaging Surveys Team},
  journal= {arXiv preprint arXiv:2507.12784},
  year   = {2026}
}

Comments

22 pages, 12 figures. Published in the Open Journal of Astrophysics