We present the development of a high-precision sample-position-autocorrection system for photoemission experiments. A binocular vision method based on image pattern matching calculations was realized to track the sample position with an accuracy better than 1 \um, which was much smaller than the spot size of the incident laser. We illustrate the performance of the sample-position-autocorrection system with representative photoemission data on the topological insulator Bi2Se3 and an optimally-doped cuprate superconductor \Bi. Our method provides new possibilities for studying the temperature-dependent electronic structures in quantum materials by laser-based or spatially resolved photoemission systems with high precision and efficiency.
@article{arxiv.2211.00823,
title = {A sample-position-autocorrection system with precision better than 1 \um~in angle-resolved photoemission experiments},
author = {Shaofeng Duan and Shichong Wang and Yuanyuan Yang and Chaozhi Huang and Lingxiao Gu and Haoran Liu and Wentao Zhang},
journal= {arXiv preprint arXiv:2211.00823},
year = {2022}
}