A novel method for determining the resistivity of compressed superconducting materials

The resistivity of a superconductor in its normal state plays a critical role in determining its superconducting ground state. However, measuring the resistivity of a material under high pressure has long presented a significant technical challenge due to pressure-induced changes in the crystallographic directions, especially for samples with anisotropic layered structures like high-Tc superconductors and other intriguing quantum materials. Here, we are the first to propose a novel and effective method for determining high-pressure resistivity, which relies on the ambient-pressure resistivity, initial sample sizes, lattice parameters, high-pressure resistance, and lattice parameters measured from the same sample. Its validity has been confirmed through our investigations of pressurized copper-oxide superconductors, which demonstrates that this method provides new possibilities for researchers conducting high-pressure studies related to resistivity of these materials.