A more accurate measurement of the $^{28}$Si lattice parameter
Data Analysis, Statistics and Probability
2020-07-22 v2 Materials Science
Abstract
In 2011, a discrepancy between the values of the Planck constant measured by counting Si atoms and by comparing mechanical and electrical powers prompted a review, among others, of the measurement of the spacing of Si {220} lattice planes, either to confirm the measured value and its uncertainty or to identify errors. This exercise confirmed the result of the previous measurement and yields the additional value am having a reduced uncertainty.
Keywords
Cite
@article{arxiv.1503.06136,
title = {A more accurate measurement of the $^{28}$Si lattice parameter},
author = {Enrico Massa and Carlo Paolo Sasso and Giovanni Mana and Carlo Palmisano},
journal= {arXiv preprint arXiv:1503.06136},
year = {2020}
}
Comments
12 pages, 17 figure, 1 table submitted to J Phys Chem Ref Data