A Meta-analytical Comparison of Naive Bayes and Random Forest for Software Defect Prediction
Software Engineering
2025-02-06 v1 Machine Learning
Abstract
Is there a statistical difference between Naive Bayes and Random Forest in terms of recall, f-measure, and precision for predicting software defects? By utilizing systematic literature review and meta-analysis, we are answering this question. We conducted a systematic literature review by establishing criteria to search and choose papers, resulting in five studies. After that, using the meta-data and forest-plots of five chosen papers, we conducted a meta-analysis to compare the two models. The results have shown that there is no significant statistical evidence that Naive Bayes perform differently from Random Forest in terms of recall, f-measure, and precision.
Keywords
Cite
@article{arxiv.2306.15369,
title = {A Meta-analytical Comparison of Naive Bayes and Random Forest for Software Defect Prediction},
author = {Ch Muhammad Awais and Wei Gu and Gcinizwe Dlamini and Zamira Kholmatova and Giancarlo Succi},
journal= {arXiv preprint arXiv:2306.15369},
year = {2025}
}
Comments
11 pages, 8 figures, Conference Paper