A Few-Shot Metric Learning Method with Dual-Channel Attention for Cross-Modal Same-Neuron Identification
Abstract
In neuroscience research, achieving single-neuron matching across different imaging modalities is critical for understanding the relationship between neuronal structure and function. However, modality gaps and limited annotations present significant challenges. We propose a few-shot metric learning method with a dual-channel attention mechanism and a pretrained vision transformer to enable robust cross-modal neuron identification. The local and global channels extract soma morphology and fiber context, respectively, and a gating mechanism fuses their outputs. To enhance the model's fine-grained discrimination capability, we introduce a hard sample mining strategy based on the MultiSimilarityMiner algorithm, along with the Circle Loss function. Experiments on two-photon and fMOST datasets demonstrate superior Top-K accuracy and recall compared to existing methods. Ablation studies and t-SNE visualizations validate the effectiveness of each module. The method also achieves a favorable trade-off between accuracy and training efficiency under different fine-tuning strategies. These results suggest that the proposed approach offers a promising technical solution for accurate single-cell level matching and multimodal neuroimaging integration.
Keywords
Cite
@article{arxiv.2504.16520,
title = {A Few-Shot Metric Learning Method with Dual-Channel Attention for Cross-Modal Same-Neuron Identification},
author = {Wenwei Li and Liyi Cai and Wu Chen and Anan Li},
journal= {arXiv preprint arXiv:2504.16520},
year = {2025}
}
Comments
23 pages, 9 figures, submitted to arXiv for public access