English

a-axis YBa2Cu3O7-x/PrBa2Cu3O7-x/YBa2Cu3O7-x trilayers with subnanometer rms roughness

Superconductivity 2024-06-19 v1 Materials Science

Abstract

We demonstrate a-axis YBa2Cu3O7-x/PrBa2Cu3O7-x/YBa2Cu3O7-x trilayers grown on (100) LaAlO3 substrates with improved interface smoothness. The trilayers are synthesized by ozone-assisted molecular-beam epitaxy. The thickness of the PrBa2Cu3O7-x layer is held constant at 8 nm and the thickness of the YBa2Cu3O7-x layers is varied from 24 nm to 100 nm. X-ray diffraction measurements show all trilayers to have >95% a-axis content. The rms roughness of the thinnest trilayer is < 0.7 nm and this roughness increases with the thickness of the YBa2Cu3O7-x layers. The thickness of the YBa2Cu3O7-x layers also affects the transport properties: while all samples exhibit an onset of the superconducting transition at and above 85 K, the thinner samples show wider transition widths, {\Delta}Tc. High-resolution scanning transmission electron microscopy reveals coherent and chemically sharp interfaces, and that growth begins with a cubic (Y,Ba)CuO3-x perovskite phase that transforms into a-axis oriented YBa2Cu3O7-x as the substrate temperature is ramped up.

Cite

@article{arxiv.2010.12624,
  title  = {a-axis YBa2Cu3O7-x/PrBa2Cu3O7-x/YBa2Cu3O7-x trilayers with subnanometer rms roughness},
  author = {Y. Eren Suyolcu and Jiaxin Sun and Berit H. Goodge and Jisung Park and Jürgen Schubert and Lena F. Kourkoutis and Darrell G. Schlom},
  journal= {arXiv preprint arXiv:2010.12624},
  year   = {2024}
}

Comments

Manuscript: 21 pages, 5 figures; supplementary materials: 12 pages, 1 table, 10 supplementary figures

R2 v1 2026-06-23T19:36:11.966Z