English

3D atomic structure determination with ultrashort-pulse MeV electron diffraction

Materials Science 2025-07-10 v1 Accelerator Physics

Abstract

Understanding structure at the atomic scale is fundamental for the development of materials with improved properties. Compared to other probes providing atomic resolution, electrons offer the strongest interaction in combination with minimal radiation damage. Here, we report the successful implementation of MeV electron diffraction for ab initio 3D structure determination at atomic resolution. Using ultrashort electron pulses from the REGAE accelerator, we obtained high-quality diffraction data from muscovite and 1TTaS21T-TaS_2, enabling structure refinements according to the dynamical scattering theory and the accurate determination of hydrogen atom positions. The increased penetration depth of MeV electrons allows for structure determination from samples significantly thicker than those typically applicable in electron diffraction. These findings establish MeV electron diffraction as a viable approach for investigating a broad range of materials, including nanostructures and radiation-sensitive compounds, and open up new opportunities for in-situ and time-resolved experiments.

Keywords

Cite

@article{arxiv.2507.06936,
  title  = {3D atomic structure determination with ultrashort-pulse MeV electron diffraction},
  author = {Vincent Hennicke and Max Hachmann and Paul Benjamin Klar and Patrick Y. A. Reinke and Tim Pakendorf and Jan Meyer and Hossein Delsim-Hashemi and Miriam Barthelmess and Sreevidya Thekku Veedu and Pontus Fischer and Ana C. Rodrigues and Arlinda Qelaj and Juna Wernsmann and Francois Lemery and Sebastian Günther and Sven Falke and Erik Fröjd and Aldo Mozzanica and Lukas Palatinus and Kai Rossnagel and Bernd Schmitt and Henry N. Chapman and Wim Leemans and Klaus Flöttmann and Alke Meents},
  journal= {arXiv preprint arXiv:2507.06936},
  year   = {2025}
}

Comments

44 pages, 4 (plus 12 supplementary) figures, 8 supplementary tables; High-energy MeV electron diffraction enables structure determinations from considerably thicker samples than currently possible

R2 v1 2026-07-01T03:53:21.143Z